Multiple-scattering effects in ExAFS of the rhenium L3 edge are calculated with the reduced angular momentum expansion (RAME) and with the modified small-scatteringcentre approximation (MSSCA). The multiple-scattering enhancement in the nearly collinear Re-0-Re bonds is very sensitive to changes in the bond angle. A comparison of the theoretical results with the pressure-dependent measurements of Alberding et a1 (1986) confirms the relation between the pressure and the bond angle that follows from the structure model of J~irgensen et a1 (1986) for the high-pressure phases in Reo3.

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We report the effect of N2 partial pressure on the structure of MgO thin films deposited on Si(100) substrates by radio frequency-magnetron sputtering in Ar+N2 mixture. The films were evaluated using x-ray diffractmeter. As increasing N2 partial pressure, the intensity of (200)MgO reflection increased and saturated above partial pressure of 4.4×10−1 Pa, which corresponds to N2 flow rate of 3 sccm. Effect of N2 gas on the structure of MgO thin films were investigated by plasma emission spectroscopy. The increase of the optical emission intensity of NH spectrum results in the increase of intensity of (200)MgO reflection. We found the strong relationship between the emission intensity of NH spectrum and intensity of (200)MgO reflection.

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A~~~~~~--E x p e r i m e n t and analysis have been done tocMrrent-~i~ed Nb-(constrictions)-NbN (S-c-S') conkacts is well described by existing theories of a mesoscopic two~r~i n~1 conductor. The quasiparticle characteristics of the Se-S' which has a~j M s~~~~e current-voltage curve Is also welt ~~~~y~ using the theory based on the single Andreev reflection mode1 without heating. In the clean S-e-S' cantxwts, there is no ~e~M r a~I e ewess noise CQnt~ibut~on associated with the Andreev reflection itself. w that the low frequency vottage noise