Polycapillary and doubly curved crystal (DCC) optics coupled with small spot x-ray sources in a special X-Beam ® package provide compact, high-sensitivity, low-power, highly stable subsystems that can be used for in situ analyzers. These analyzers provide remote, unattended use for environmental applications, bench-top or in-line instruments for industrial applications, and point-of-care clinical instruments for medical diagnosis or monitoring. Micro x-ray fluorescence (µXRF) and monochromatic micro x-ray fluorescence (MµXRF) can be used to measure trace element concentrations and distributions. Parallel-beam and convergent-beam x-ray diffraction (XRD) can be used for in situ phase composition, texture, strain, and crystal structure measurements.

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