A unified fundamental understanding of interfacial thermal transport is missing due to the complicated nature of interfaces. Because of the difficulty to grow high-quality interfaces and lack of materials characterization, the experimentally measured thermal boundary conductance (TBC) in the literature are usually not the same as the ideally modelled interfaces. This work provides a systematic study of TBC across the highest-quality (atomically sharp, harmonic-matched, and ultraclean) epitaxial (111) Al||(0001) sapphire interfaces to date. The comparison of measured high TBC with theoretical models shows that elastic phonon transport dominates the interfacial thermal transport and other mechanisms play negligible roles. This is confirmed by a nearly constant transmission coefficient by scaling the TBC with the Al heat capacity and sapphire heat capacity with phonon frequency lower than 10 THz. Finally, the findings in this work will impact applications such as electronics thermal management, thermoelectric energy conversion, and battery safety.

The power efficiencies of state-of-the-art AlxGa1-xN deep-ultraviolet (UV) emitters operating in the <300 nm wavelength region are currently limited to a few percent in part due to limitations in the series and contact resistance which result in excessive drive voltages. AlxGa1-xN tunnel contacts and tunnel junctions in deep-UV devices are a promising route toward increasing these efficiencies by improving the contact resistances, hole injection, and reducing optical absorption by removing undesirable p-GaN contact layers. However, due to doping inefficiencies, standalone tunnel diodes have not been realized in the form of homojunction AlxGa1-xN. In this work, AlxGa1-xN (0.19 ≤ x ≤ 0.58) homojunction tunnel diodes are fabricated with high reverse bias current densities, and one device with x = 0.19 demonstrates a negative differential resistance at ∼2.4 V. AlxGa1-xN p++/n++/n tunnel diodes are compared to reference p++/i/n diodes to provide clarity about the role of tunneling conduction vs leakage conduction. Transmission electron microscopy verifies that heavy doping does not result in visible defects such as Mg precipitates and allows for subsequent epitaxy, critical for buried tunnel junction structures. Increasing the bandgap energy of AlxGa1-xN for higher Al content tunnel junctions decreases the tunnel current, but still allows sufficient conduction necessary for future improvements in deep UV emitter efficiencies.

While metal modulated epitaxy (MME) has been shown useful for hyperdoping, where hole concentrations 40 times higher than other techniques have been demonstrated, and the ability to control phase separation in immiscible III-nitrides, the complexity of the dynamically changing surface conditions during the cyclic growth is poorly understood. While MME is capable of superb crystal quality, performing MME in an improper growth regime can result in defective material. These complications have made the transfer of MME knowledge challenging. This work provides a comprehensive study of the conditions necessary for achieving the benefits of MME while avoiding undesirable defects. The effects of growth temperature, Ga/N ratio, and excess Ga dose per MME growth cycle on the morphological, structural, electronic, and optical properties of unintentionally doped (UID) MME grown gallium nitride (GaN) have been investigated. Optimal structural and electrical quality were achieved for GaN films grown at ∼650 °C, at pre-bilayer Ga coverage and at the moderate droplet regime. However, high defect concentrations were observed at the lowest growth temperatures, and counter to traditional MBE, as the excess Ga dose transitioned from bilayer coverage to the low droplet regime. Optoelectronic properties were optimal for films grown at intermediate growth temperatures, an excess Ga dose condition just before the droplet formation, and, at a III/V ratio of 1.3. Optimization of growth temperatures, Ga/N ratios, and excess Ga dose results in a range of growth conditions achieving smooth surfaces, step-flow surface morphology, and high crystalline quality films with low threading dislocation densities, allowing researchers to utilize the extensive advantages of MME.

Aluminum nitride (AlN) is an insulator that has shown little promise to be converted to a semiconductor via impurity doping. Some of the historic challenges for successfully doping AlN include a reconfigurable defect formation known as a DX center and subsequent compensation that causes an increase in dopant activation energy resulting in very few carriers of electricity, electrons, or holes, rendering doping inefficient. Using crystal synthesis methods that generate less compensating impurities and less lattice expansion, thus impeding the reconfiguration of dopants, and using new dopants, we demonstrate: (a) well behaved bulk semiconducting functionality in AlN, the largest direct bandgap semiconductor known with (b) substantial bulk p-type conduction (holes = 3.1 × 1018 cm−3, as recently reported in our prior work), (c) dramatic improvement in n-type bulk conduction (electrons = 6 × 1018 cm−3, nearly 6000 times the prior state-of-the-art), and (d) a PN AlN diode with a nearly ideal turn-on voltage of ∼6 V for a 6.1 eV bandgap semiconductor. A wide variety of AlN-based applications are enabled that will impact deep ultraviolet light-based viral and bacterial sterilization, polymer curing, lithography, laser machining, high-temperature, high-voltage, and high-power electronics.

Highly doped GaN p–n tunnel junction (TJ) contacts to InGaN solar cells are demonstrated, in which the TJs were grown by molecular beam epitaxy on top of active solar cell regions grown by metalorganic chemical vapor deposition. The effects of Si and Mg doping concentrations on solar cell characteristics are studied and used to improve turn-on voltage and series resistance. The highest doped cell with a TJ has an open-circuit voltage of 2.2 V, similar to that of the control cell fabricated using indium tin oxide (ITO), and a far less short-circuit current density loss from unwanted photogeneration in the TJ contact than in the ITO contact.