The
saturated temperatures of ethylphenyldimethoxysilane (EPDMOS)
and ethylphenyldiethoxysilane (EPDEOS) were determined using an inclined
ebulliometer from 2.035 to 64.0 kPa. The experimental data were fitted
with the Antoine and Clarke–Glew equations by a weighted least-squares
regression method, which yielded Antoine parameters (A = 9.1280, B = 1590.18, C = −100.39
K and A = 9.1049, B = 1678.64, C = −102.84 K) and standard vaporization enthalpies
(Δ
l
g
H
m
0(298.15 K) = 62.52 kJ·mol–1 and Δ
l
g
H
m
0(298.15 K) = 65.19 kJ·mol–1) for EPDMOS and EPDEOS, respectively. The critical
properties of EPDMOS and EPDEOS, such as critical temperature, pressure,
and volume, were estimated by the group contribution method introduced
by Nannoolal et al. The acentric factors of EPDMOS and EPDEOS were
estimated from these critical parameters and the reduced saturated
vapor pressures calculated from either the Clarke–Glew equation
or the Antoine equation.
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