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The results of microwave measurements for some objects combining multifrequency measurements and transversal scanning is presented. Longitudinal distance dependencies of reflectivity have been obtained by synthesis from multifrequency data. The multifrequency measurements and synthesis have been done in real-time. The measurements in free space were carried out by the apparatus using measuring modules of scalar reflectometer of series Р2 (R2). The combination of data in longitudinal and transversal directions produced radio images of some dielectric structures.