Examines the processes that occur in active regions of the elements of chips, under the influence of heavy charged particles. Defined formulas for estimation of ionization reaction.

The paper Considers issues of modeling and evaluation epigastric noise, that are induced in the chip interconnects. This allowed us to calculate the noise that occurs when switching signals tires due to capacitive relations under-spoons. The proposed approach allows to increase the accuracy of calculations of the parameters of the substrate, executed SubstrateStorm company Cadence.