38‐4: Invited Paper: Inline Screening Known Good Die (KGD) Mapping for MicroLEDs

Abstract

MicroLED displays have many key advantages over other display technologies. Cost, however, remains a key challenge to wide market acceptance. Reducing cost requires improvements in micro LED chip yield and reliability. This, in turn, will necessitate a shift in the process control mindset from traditional LED to that more typical of mainstream semiconductor manufacturing processes. Furthermore, elements of automotive semiconductor reliability control, such as die screening based on inline defectivity may also be necessary to meet the yield, reliability, and cost targets.