3D mapping of orientation variation and local residual stress within individual grains of pearlitic steel using synchrotron dark field X-ray microscopy

Yildirim, Can; Jessop, Casey; Ahlström, Johan; Detlefs, C.; Zhang, Yubin

doi:10.1016/j.scriptamat.2021.113783

Cited by 17 publications

(14 citation statements)

References 32 publications

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“…11 Schematic illustration and applications of DFXM. a A schematic illustration of DFXM [224]. b 110 diffraction ring recorded by the area detector where each bright spot corresponds to a specific grain [224].…”

Section: Newly Emerging Sr-based Technologiesmentioning

confidence: 99%

“…a A schematic illustration of DFXM [224]. b 110 diffraction ring recorded by the area detector where each bright spot corresponds to a specific grain [224]. c Relative orientation, misorientation, and strain maps of Grain 1 selected from diffraction ring [224].…”

Section: Newly Emerging Sr-based Technologiesmentioning

confidence: 99%

“…b 110 diffraction ring recorded by the area detector where each bright spot corresponds to a specific grain [224]. c Relative orientation, misorientation, and strain maps of Grain 1 selected from diffraction ring [224]. d 3D reconstruction from DFXM [225] refractive lens (CRL) was installed at the back focal plane, and an inverted 2D projection of the grain was captured by the area detector downstream of the sample, where the magnification factor was determined by the sample-CRL and CRL-detector separations [224].…”

Section: Newly Emerging Sr-based Technologiesmentioning

confidence: 99%

“…c Relative orientation, misorientation, and strain maps of Grain 1 selected from diffraction ring [224]. d 3D reconstruction from DFXM [225] refractive lens (CRL) was installed at the back focal plane, and an inverted 2D projection of the grain was captured by the area detector downstream of the sample, where the magnification factor was determined by the sample-CRL and CRL-detector separations [224]. Similar to SR-CT, the 3D morphology of the grain can be reconstructed by rotating a sample to collect 2D projections from different directions.…”

Section: Newly Emerging Sr-based Technologiesmentioning

confidence: 99%

“…A typical application of DFXM is to evaluate the local residual stress and grain orientations. Yildirim et al [224] conducted the DFXM experiments to map 3D lattice profiles in two specific grains in pearlitic steels at nanometer resolution, as shown in Fig. 11b,c.…”

Section: Newly Emerging Sr-based Technologiesmentioning

confidence: 99%

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Recent Progress of Synchrotron X-Ray Imaging and Diffraction on the Solidification and Deformation Behavior of Metallic Materials

Peng

Miao

Sun

et al. 2021

Acta Metall. Sin. (Engl. Lett.)

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Characterizing the microstructure and deformation mechanism associated with the performances and properties of metallic materials is of great importance in understanding the microstructure-property relationship. The past few decades have witnessed the rapid development of characterization techniques from optical microscopy to electron microscopy, although these conventional methods are generally limited to the sample surface because of the intrinsic opaque nature of metallic materials. Advanced synchrotron radiation (SR) facilities can produce X-rays with strong penetrability and high spatiotemporal resolution, and thereby enabling the non-destructive visualization of full-field structural information in three dimensions. Tremendous endeavors were devoted to the 3rd generation SR over the past three decades, in which X-ray beams have been focused down to 100 nm. In this paper, recent progresses on SR-related characterization technologies were reviewed, with particular emphases on the fundamentals of synchrotron X-ray imaging and synchrotron X-ray diffraction, as well as their applications in the in situ observations of material preparation (e.g., in situ dendrite growth during solidification) and service under extreme environment (e.g., in situ mechanics). Future innovations toward next-generation SR and newly emerging SRbased technologies such as dark-field X-ray microscopy and Bragg coherent X-ray diffraction imaging were also advocated.

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Section: Newly Emerging Sr-based Technologiesmentioning

confidence: 99%