Abstract:Traditional topography measurements for rough objects are usually based on point-contact scan. The way of pointcontact scan is usually not a high-efficient way to obtain data. Hence, in practice, only a few traces are measured which result in limited data. In order to obtain topography of sufficient amount of data, the demand for rapid noncontact measurement is increasing. In this work, we propose a dual wavelength digital holography (DWDH) measurement system with a synthetic wavelength of 51µm . We apply the … Show more
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