3D Micro-PIXE at atmospheric pressure: A new tool for the investigation of art and archaeological objects

Kanngießer, Birgit; Karydas, A. G.; Schütz, R.; Sokaras, Dimosthenis; Reiche, Ina; Röhrs, Stefan; Pichon, Laurent; Salomon, J.

doi:10.1016/j.nimb.2007.09.019

Cited by 21 publications

(13 citation statements)

References 16 publications

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“…The attenuation length m À1 for the Ti Ka-line in Ti metal is 20.2 mm, 22 while the 2 MeV proton range is 30.3 mm. 23 In this case, the X-ray attenuation length limits the lateral resolution of the method to 32 mm (eqn (11)). The standard analysed frame composed of 256 Â 256 pixels was measured over an area of 2400 Â 2400 mm 2 .…”

Section: Resultsmentioning

confidence: 99%

“…The approaches with micro-XRF include, among others, confocal 3D-XRF tomography using polycapillary X-ray lenses [1][2][3][4] and its combination with micro-CT. 5 Efforts to enhance the three-dimensional sensitivity of micro-PIXE include STIM-PIXE tomography [6][7][8][9] and confocal PIXE. [10][11][12][13] The precise characterisation of roughness and surface topography is of importance for the determination of functional properties of material surfaces, especially for surfaces characterized by a diverse microstructure with a number of irregularities. A wide range of surface analysis techniques are able to provide surface topography information, including contact methods and non-contact methods based on photon, electron and ion interaction with solid targets.…”

Section: Introductionmentioning

confidence: 99%

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Surface topography reconstruction by stereo-PIXE

Hatam

Pelicon

Vavpetič

et al. 2012

J. Anal. At. Spectrom.

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A method of sample surface topography reconstruction is described based on the asymmetry in the X-ray yields acquired by a pair of X-ray detectors positioned at opposite sides of the probing beam. The yield asymmetries in the two simultaneously acquired elemental maps are caused by differences in the X-ray absorption along the X-ray exit route in the sample with a topographically structured surface. The approach presented introduces an asymmetry factor of the X-ray intensity in each of the image pixels to obtain an image asymmetry matrix. The dependence of the asymmetry factor on the local target inclination in the detector plane is calculated for a flat sample surface model. The image asymmetry matrix is then converted into the local inclination angle matrix. As the last step, the surface topography is then reconstructed from the local inclination angle. The method is based on X-ray absorption phenomena and could be applied equivalently in X-ray elemental mapping methods using excitation beams with a well-defined direction in the sample. This includes micro-X-Ray Fluorescence analysis (micro-XRF) and micro-Proton Induced X-ray Emission (micro-PIXE). We demonstrated the method by topographic analysis of engraved metallic samples with stereo-PIXE and compared it with the results of stylus profilometry. The smallest value of the X-ray production depth and the characteristic X-ray attenuation length determines the lateral resolution of the proposed topography reconstruction method.

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Section: Resultsmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Surface topography reconstruction by stereo-PIXE

Hatam

Pelicon

Vavpetič

et al. 2012

J. Anal. At. Spectrom.

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“…A 3D element-specific distribution of aerosol microparticles captured in a thick quartz filter was reconstructed by using this confocal micro-PIXE facility. The depth intensity profiles of the major elements that compose the patina layer of a quaternary bronze alloy were also measured (Kanngießer et al 2007, Žitnik et al 2008, Grlj et al 2011). There is similar confocal technology based on a micro electron beam in the excitation channel and a PPXRL or a PFXRL in the detection channel for energy dispersive or wavelength dispersive X-ray analysis (Schields et al 2002, Tanaka et al 2008).…”

Section: Experimental Design For Confocal Xrfmentioning

confidence: 99%

Confocal X-ray technology based on capillary X-ray optics

Sun¹,

Ding²

2015

Reviews in Analytical Chemistry

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Capillary X-ray optics is versatile, and it can be used with synchrotron radiation source, conventional X-ray source, laser-plasma ultrafast X-ray source, and so forth. Recently, the confocal X-ray technology based on capillary X-ray optics has become popular, and it has been widely used in X-ray fluorescence, X-ray absorption fine structure, X-ray diffraction, small-angle X-ray scattering, X-ray imaging, and X-ray scattering. This confocal X-ray technology has applications in many fields, including environmental monitoring, food science, life science, chemistry, physics, nanomaterials, nondestructive test, security check, and so on.

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“…Further, 3D micro-PIXE also has been developed to perform depth analysis recently [107,108] and has the spatial resolution of 4 µm by using characteristic Ti-K-X rays (4.558 keV) produced by 3 MeV protons with beam spot size of ~1 µm [109].…”

Section: Multielement Distributionmentioning

confidence: 99%

Metallomics, elementomics, and analytical techniques

Chen

et al. 2008

Pure and Applied Chemistry

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Metallomics is an emerging and promising research field which has attracted more and more attention. However, the term itself might be restrictive. Therefore, the term "elementomics" is suggested to encompass the study of nonmetals as well. In this paper, the application of state-of-the-art analytical techniques with the capabilities of high-throughput quantification, distribution, speciation, identification, and structural characterization for metallomics and elementomics is critically reviewed. High-throughput quantification of multielements can be achieved by inductively coupled plasma-mass spectrometry (ICP-MS) and neutron activation analysis (NAA). High-throughput multielement distribution mapping can be performed by fluorescence-detecting techniques such as synchrotron radiation X-ray fluorescence (SR-XRF), XRF tomography, energy-dispersive X-ray (EDX), proton-induced Xray emission (PIXE), laser ablation (LA)-ICP-MS, and ion-detecting-based, secondary-ion mass spectrometry (SIMS), while Fourier transform-infrared (FT-IR) and Raman microspectroscopy are excellent tools for molecular mapping. All the techniques for metallome and elementome structural characterization are generally low-throughput, such as X-ray absorption spectroscopy (XAS), NMR, and small-angle X-ray spectroscopy (SAXS). If automation of arraying small samples, rapid data collection of multiple low-volume and -concentration samples together with data reduction and analysis are developed, high-throughput techniques will be available and in fact have partially been achieved.

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3D Micro-PIXE at atmospheric pressure: A new tool for the investigation of art and archaeological objects

Cited by 21 publications

References 16 publications

Surface topography reconstruction by stereo-PIXE

Surface topography reconstruction by stereo-PIXE

Confocal X-ray technology based on capillary X-ray optics

Metallomics, elementomics, and analytical techniques

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