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Uchil, J.; Mahesh, K.K.; Kumara, K. Ganesh

doi:10.1023/a:1012908222409

Cited by 24 publications

(46 citation statements)

References 6 publications

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“…As known, transformations temperatures can be determined by differential scanning calorimetry [221,222], dilatometry [223] or electrical resistivity [224,225]. However, transformation temperatures of the thermal affected regions in NiTi welds have been mostly determined by differential scanning calorimetry, despite their small dimensions.…”

Section: Phase Transformation Temperaturesmentioning

confidence: 99%

Welding and Joining of NiTi Shape Memory Alloys: A Review

Oliveira

Miranda

Fernandes

2017

Progress in Materials Science

285

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Section: Phase Transformation Temperaturesmentioning

confidence: 99%

Welding and Joining of NiTi Shape Memory Alloys: A Review

Oliveira

Miranda

Fernandes

2017

Progress in Materials Science

285

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“…The occurrence of this phase has since formed the subject of many research efforts, [8,14] particularly with respect to its influence on stabilizing the transformation temperatures during thermal cycling. [10,15,16] Several studies of binary TiNi alloys (either equiatomic or slightly Ti rich in composition) have observed the R phase following five to eight thermal cycles, when it had not been evident in earlier cycles. [12,[15][16][17] This has led to speculation that the stability of the R phase can be increased by the introduction of defects during early thermal cycles, thus altering the transformation sequence from B2 fi B19¢ to B2 fi R fi B19¢.…”

Section: Introductionmentioning

confidence: 99%

In-Situ Synchrotron Characterization of Transformation Sequences in TiNi-Based Shape Memory Alloys during Thermal Cycling

Jones

Raghunathan

Dye

2010

Metall Mater Trans A

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In-situ synchrotron radiation has been used to provide direct analysis of the transformation sequences in TiNi-based shape memory alloys during thermal cycling. The high resolution, narrow peak width Debye-Scherrer diffraction spectra enabled positive identification and quantification of the phase transformation sequences, which is not possible through normal laboratory studies. The results facilitate a clearer understanding of the development and influence of intermediate phases such as R or B19 on sequential martensitic transformations. Ti 50.2 Ni 49.8 transformed predominately via a single-step B2 M B19¢ transformation, although evidence of the R phase was found during cooling in every cycle. The martensitic start temperature was depressed by~0.6°C per cycle, while the R-phase start temperature was found to be unaffected. Ti 50 Ni 41 Cu 9 transformed through a two-step B2 M B19 M B19¢ sequence, with the B2 fi B19 transformation reaching completion prior to the formation of any B19¢. The transformation temperatures of Ti 50 Ni 41 Cu 9 were found to be insensitive to thermal cycling, remaining constant over the studied cycle range.

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“…The electrical resistivity of Ni-Ti thin films was measured by four probe resistivity method [30,31] using a liquid nitrogen cryo-cooler and Keithley instruments over room temperature. The contacts over the samples were made with silver paint.…”

Section: Resistivitymentioning

confidence: 99%

Characterisation and properties of magnetron sputtered nanoscale bi‐layered Ni/Ti thin films and effect of annealing

Behera

Aich

2015

Surface & Interface Analysis

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Single-bi-layer of Ni-Ti thin film was deposited using DC and RF magnetron sputtering technique by layer-wise deposition of Ni and Ti on Si(100) substrate in the order of Ni as the bottom layer and Ti as the top layer. The deposition of these amorphous as-deposited thin films was followed by annealing at 300°C, 400°C, 500°C, and 600°C temperature with 1-h annealing time for each to achieve crystalline thin films. This paper describes the fabrication processes and the novel characterization techniques of the as-deposited as well as the annealed thin films. Microstructures were analysed using FESEM and HRTEM. Nanoindentation and AFM were carried out to characterize the mechanical properties and surface profiles of the films. It was found that, for the annealing temperatures of 300°C to 600°C, the increase in annealing temperature resulted in gradual increase in atomiccluster coarsening with improved ad-atom mobility. Phase analyses, performed by GIXRD, showed the development of silicide phases and intermetallic compounds. Cross-sectional micrographs exhibited the inter-diffusion between the two-layer constituents, especially at higher temperatures, which resulted either in amorphization or in crystallization after annealing at temperatures above 400°C.

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Cited by 24 publications

References 6 publications

Welding and Joining of NiTi Shape Memory Alloys: A Review

Welding and Joining of NiTi Shape Memory Alloys: A Review

In-Situ Synchrotron Characterization of Transformation Sequences in TiNi-Based Shape Memory Alloys during Thermal Cycling

Characterisation and properties of magnetron sputtered nanoscale bi‐layered Ni/Ti thin films and effect of annealing

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