A 600V FS-IGBT using locally isolated P-well structures for improved short circuit ruggedness

Kim, Jisun; Kim, Sooseong; Oh, Kwang-Hoon; Yun, Chong-Man

doi:10.1109/icpe.2015.7167877

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A 600V FS-IGBT using locally isolated P-well structures for improved short circuit ruggedness

Cited by 3 publications

References 6 publications

Investigation on Formation and Evolution Behavior of Short-Circuit Path in Press-Pack IGBT Modules

Investigation on Formation and Evolution Behavior of Short-Circuit Path in Press-Pack IGBT Modules

Design and Fabrication of Fs-Igbt with Strong Short-Circuit Ruggedness

An Investigation of How Circuit Parameters Affect the Short-Circuit Type 2 Ruggedness in Fs-Igbt

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