A Chip-Level Testing Platform of Unmanned Vehicle Autopilot Systems with FPGA-Based Hardware-in-the-Loop Simulation

Abstract

Nowadays, unmanned vehicles are widely used in various fields. However, the safety of unmanned vehicles is directly determined by the autopilot systems, and sensor faults are a very critical factor that affects the normal operation of the autopilot systems. To efficiently and comprehensively test unmanned systems for sensor faults, this paper proposes a chip-level testing platform for unmanned vehicle autopilot systems based on FPGA hardware-in-the-loop simulation. Unlike existing testing platforms, the introduction of FPGA technology allows us to achieve nanosecond real-time simulation frequency, thus realizing chip-level simulation of sensors and black-box automated testing. Firstly, we propose a set of general platform and modeling methods, and the paper presents a detailed application of the four most common necessary sensors in autopilot systems as examples. Secondly, we propose for the first time a chip-level fault testing method for unmanned systems, and build a test platform with a quadrotor vehicle, the PX4 software platform, and the Pixhawk4 hardware platform as examples. Finally, the experimental results verify that the testing platform proposed in this paper can adapt to various autopilot systems and has high simulation test reliability.