2024
DOI: 10.1039/d4cp00426d
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A combined AIMD and DFT study of the low-energy radiation responses of GaN

Ming Jiang,
Nuo Cheng,
Xin-Yu Zhu
et al.

Abstract: For the promising semiconductor of GaN, the degradation of the GaN-based devices’ performance may occur, when they are bombarded by high-energy charged particles in the applications of aerospace, astronomy, and...

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