A compact half butterfly chipless RFID tag based on image theory with DER analysis

Zarif, Amir Hossein; Mohammad-Ali-Nezhad, Sajad; Tijeri-Mofrad, Sajjad; Gazestani, Amirhossein Hajihoseini

doi:10.1016/j.aeue.2020.153486

Cited by 2 publications

(1 citation statement)

References 23 publications

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“…With Radio Frequency Identification (RFID) technology development, many commercial devices are applied in diverse scenarios [1] [2][3] such as health-caring monitoring [4], goods tracking [5] [6], classification, localization and stuff management [7]. Most of them are developed by welding integrated circuit (IC) chips on a hard or flexible Printed Circuit Board (PCB) [8] or a chipless way [9] [10]. The welding technique for connecting chips to RFID antennas on PCBs is proven and reliable.…”

Section: Introductionmentioning

confidence: 99%

Experimental comparison of three electro-textile interfaces for textile UHF-RFID tags on clothes

Luo

Gil

Fernández‐García

2022

AEU - International Journal of Electronics and Communications

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Section: Introductionmentioning

confidence: 99%

Experimental comparison of three electro-textile interfaces for textile UHF-RFID tags on clothes

Luo

Gil

Fernández‐García

2022

AEU - International Journal of Electronics and Communications

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Local Sensitivity Analysis and Monte Carlo Simulation to Examine the Effects of Chipless RFID Measurement Uncertainties—Part I: Misalignment-Based Uncertainty

Brinker

Zoughi

2022

IEEE Open J. Instrum. Meas.

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Measurement and response decoding is an ongoing challenge in the chipless radio frequency identification (RFID) field. Measurement uncertainties, including tag/reader misalignment, RCS or S-parameter error, and clutter, can cause response distortions, such as magnitude changes and resonant frequency shifts. These response distortions can lead to the improper assignment of a binary code or sensing parameter (i.e., improper decoding). This work aims to use local sensitivity analysis and Monte Carlo simulation to fully characterize the effects of misalignment, response parameter measurement error (e.g., VNA S-parameter error), and clutter on chipless RFID tag responses. From this type of comprehensive characterization, conclusions are drawn about the identification (ID) and sensing capabilities of the tags. In this work the simulations are performed for two specific tags and the results are then corroborated with measurements of one of the tags. While the work is done for a near-field monostatic measurement setup, it is presented such that the same procedures can be applied to other tags and measurement setups, including far-field scenarios. Thus, a novel comprehensive tag performance assessment framework is provided. This work is divided into two parts. In this part, Part I, the effects of tag/reader misalignment uncertainty are examined in depth through both simulations and measurements. In Part II, the effects of S-parameter error, clutter-based uncertainty, and the combination of these uncertainties with misalignment uncertainty are investigated. An example demonstrating the application of this tag performance assessment framework is also provided in Part II.

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A compact half butterfly chipless RFID tag based on image theory with DER analysis

Cited by 2 publications

References 23 publications

Experimental comparison of three electro-textile interfaces for textile UHF-RFID tags on clothes

Experimental comparison of three electro-textile interfaces for textile UHF-RFID tags on clothes

Local Sensitivity Analysis and Monte Carlo Simulation to Examine the Effects of Chipless RFID Measurement Uncertainties—Part I: Misalignment-Based Uncertainty

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