A comparative study of work function variations in III-V heterojunction and homojunction tunnel field-effect transistors

Guan, Yunhe; Lu, Jiachen; Zhang, Hao; Dou, Zhen; Chen, Haifeng; Liang, Feng

doi:10.1016/j.mejo.2024.106118

Microelectronics Journal

2024

DOI: 10.1016/j.mejo.2024.106118

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A comparative study of work function variations in III-V heterojunction and homojunction tunnel field-effect transistors

Yunhe Guan,

Jiachen Lu,

Hao Zhang

et al.

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A comparative study of work function variations in III-V heterojunction and homojunction tunnel field-effect transistors

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References 31 publications

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