A computerized data acquisition system for measuring planarity deviations with electronic levels

Teleshevskii, V. I.; Glubokov, A. V.

doi:10.1007/s11018-004-0004-x

Cited by 2 publications

(3 citation statements)

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“…In accordance with regulatory documents, the adjacent plane should be used as a reference. Studies [13,14,17,18] show that the value of the error caused by the choice of the reference base can reach 50%, which is unacceptable in most cases. The construction of the adjacent plane is reduced to solving the minimax problem:…”

Section: Determination Of Flatness Valuementioning

confidence: 99%

“…Algorithms for constructing basic elements are well studied. The authors of [6][7][8][9][10][11][12][13] summarized the methods used for constructing basic elements when measuring shape deviations. Lakota and Gorog [10] considered strategies for measuring flatness deviations and estimated the methodological measurement error depending on the number of measured points.…”

Section: Introductionmentioning

confidence: 99%

“…When measuring extended surfaces, the use of CMM is practically impossible, which significantly changes the formulation of the measurement problem. Teleshevskii et al [13] considered the development of a measuring system based on electronic levels and showed the dependence of the methodological error on the number of measured points. To measure deviations from straightness, studies were carried out on the choice of the number of measured points and appropriate recommendations were developed [14].…”

Section: Introductionmentioning

confidence: 99%

See 2 more Smart Citations

Automated measuring system for straightness and flatness deviations of extended surfaces

Glubokov¹,

Glubokova²,

Afonina³

et al. 2022

Optical Metrology and Inspection for Industrial Applications IX

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The article developed an approach to improve the accuracy of measuring deviations from straightness and flatness of extended surfaces. One of the most accurate and productive methods for measuring deviations from straightness and flatness of extended surfaces is the step method using electronic levels. The main difficulty of the measurement lies in the correct positioning of the electronic level on the measured surface. Algorithms for processing the results of measurements assume the coincidence of the measured points during successive measurements. Otherwise, a significant methodological error is introduced. A technique for recognizing the position of the level on the measured surface is proposed based on the analysis of images obtained from video cameras. The advantage of the algorithm is its resistance to determining the position of the level, regardless of its orientation on the measured surface. Software has been developed to correct the position of the level on the measured surface. An algorithm for determining the adjacent plane based on the gradient descent method is proposed. The dependences of the methodological measurement error on the number of measured points and the accuracy of their determination are revealed.

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Section: Determination Of Flatness Valuementioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Automated measuring system for straightness and flatness deviations of extended surfaces

Glubokov¹,

Glubokova²,

Afonina³

et al. 2022

Optical Metrology and Inspection for Industrial Applications IX

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show abstract

Spectral Parameters of Straightness Deviation Evaluation

Glubokov

Glubokova

Shulepov

et al. 2016

MSF

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Spectral analysis of different profiles obtained during straightness deviation measurement was performed. The several profiles are showed, for which the value of straightness deviation is the same, but its behavior differs greatly. Spectral parameters characterizing the type of straightness deviation are proposed. The automated system based on factors of fuzzy-set theory with implementation in the form of neural network is developed.

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A computerized data acquisition system for measuring planarity deviations with electronic levels

Cited by 2 publications

References 0 publications

Automated measuring system for straightness and flatness deviations of extended surfaces

Automated measuring system for straightness and flatness deviations of extended surfaces

Spectral Parameters of Straightness Deviation Evaluation

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