2023 IEEE Far East NDT New Technology &Amp;amp; Application Forum (FENDT) 2023
DOI: 10.1109/fendt59575.2023.10461514
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A fast finite element modeling and solving method for 2D defect magnetic leakage field

Yu-Fei Wang,
Wen-Hua Han,
Li-Shuang Ru
et al.
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