2015
DOI: 10.1145/2699838
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A Fault-Aware Toolchain Approach for FPGA Fault Tolerance

Abstract: As the size and density of silicon chips continue to increase, maintaining acceptable manufacturing yields has become increasingly difficult. Recent works suggest that lithography techniques are reaching their limits with respect to enabling high yield fabrication of small-scale devices, thus there is an increasing need for techniques that can tolerate fabrication time defects. One candidate technology to help combat these defects is reconfigurable hardware. The flexible nature of reconfigurable devices, such … Show more

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Cited by 5 publications
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