A general purpose design-for-test methodology at the analog-digital boundary of mixed-signal VLSI

Abstract

A general-purpose modular-based scan chain between the analog-digital boundary of a mixed analog/digital design is proposed. This general-purpose Design-For-Test methodology is oriented towards the test of the mixed-signal modules within the design. Implementing this structure improves the controllability and observability of these modules and the reusability of the test software at a minimum cost.