2024
DOI: 10.1109/tap.2024.3484673
|View full text |Cite
|
Sign up to set email alerts
|

A HIE S-FDTD Method to Account for Geometrical and Material Uncertainties in Lossy Thin Panels

Miguel Ruiz-Cabello Núñez,
Alberto Prados Pérez,
Luis Díaz Angulo
et al.
Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Publication Types

Select...

Relationship

0
0

Authors

Journals

citations
Cited by 0 publications
references
References 17 publications
0
0
0
Order By: Relevance

No citations

Set email alert for when this publication receives citations?