A Hybrid Low-Cost PLL Test Scheme based on BIST Methodology

Abstract

In this paper, a hybrid built-in self-test (BIST) scheme is firstly proposed for phase-locked loop (PLL) production test and performance characterization. The scheme combines the structure test and function test in production test operation. The former is to detect hard faults and the latter is used to improve the soft fault coverage. Jitter measurement is selected as a typical parameter test in performance characterization mode, which includes vernier delay line (VDL) to measure timing jitter and undersampling technology to measure cycle-cycle jitter. The goal of the scheme is to enable complete production quality test and exact performance characterization.