A Low Cost System for Self Measurements of Power Consumption in Field Programmable Gate Arrays

Oliver, Juan Pablo; Veirano, Francisco; Bouvier, Diego A.; Boemo, Eduardo

doi:10.1166/jolpe.2017.1465

Cited by 2 publications

(1 citation statement)

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“…The authors in [20] propose a system that is based on a current-frequency conversion block that measures the power consumption of a running application in real-time. However, the authors present the power measurement methodology without mentioning the different types of noise that can be induced by the different electronic blocks and their effects on the accuracy and the accuracy of the physical measurements.…”

Section: B External Measurement Setupmentioning

confidence: 99%

RTL to Transistor Level Power Modeling and Estimation Techniques for FPGA and ASIC: A Survey

Nasser

Lorandel

Prévotet

et al. 2021

IEEE Trans. Comput.-Aided Des. Integr. Circuits Syst.

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Power consumption constitutes a major challenge for electronics circuits. One possible way to deal with this issue is to consider it very soon in the design process in order to explore various design choices. A typical design flow often starts with a high-level description of a full system, which imposes to provide accurate models. Power modelling techniques can be employed, providing a way to find a relationship between power and other metrics. Furthermore, it is also important to consider efficient power characterization techniques. The role of this paper is, first, to provide an overview of RTL to transistor level power modelling and estimation techniques for FPGAs and ASICs devices. Second, it aims at proposing a classification of all approaches according to defined metrics, which should help designers in finding a particular method for their specific situation, even if no common reference is defined among the considered works. Index Terms-Power consumption, power modelling, power estimation, high-level power estimation, FPGA, ASIC, tools.. Antifuse Technology (e.g., Actel TM , Quicklogic TM): an antifuse remains in a high-impedance state until it is programmed into a low-impedance or "fused" state (Figure 9.18). This technology can be used only once on one-time programmable (OTP) devices; it is less expensive than the RAM technology.

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Section: B External Measurement Setupmentioning

confidence: 99%