2021 IEEE MTT-S International Microwave Symposium (IMS) 2021
DOI: 10.1109/ims19712.2021.9574883
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A Low EM Susceptibility VCO with Four-leaf-clover-shaped Inductor Verified via Chip-level 3D Near-field Measurement Technique

Yin‐Cheng Chang
1
,
Tzu Chau Lin
2
,
Chao-Ping Hsieh
3
et al.
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