2016
DOI: 10.1016/j.mssp.2015.08.019
|View full text |Cite
|
Sign up to set email alerts
|

A new 4H-SiC hydrogen sensor with oxide ramp termination

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3

Citation Types

0
3
0

Year Published

2017
2017
2022
2022

Publication Types

Select...
7

Relationship

2
5

Authors

Journals

citations
Cited by 10 publications
(3 citation statements)
references
References 37 publications
0
3
0
Order By: Relevance
“…Although their optimal operation usually requires heating, this aspect is lower for industrial applications where the various processes that demand gas monitoring also entail elevated temperatures. For such hostile environments, silicon carbide (SiC) H 2 MOS capacitor sensors are a suitable variant [16,[20][21][22][23][24][25]. These sensors have been shown to be able to operate at high temperatures [16,20] up to 500 • C [16].…”
Section: Introductionmentioning
confidence: 99%
See 1 more Smart Citation
“…Although their optimal operation usually requires heating, this aspect is lower for industrial applications where the various processes that demand gas monitoring also entail elevated temperatures. For such hostile environments, silicon carbide (SiC) H 2 MOS capacitor sensors are a suitable variant [16,[20][21][22][23][24][25]. These sensors have been shown to be able to operate at high temperatures [16,20] up to 500 • C [16].…”
Section: Introductionmentioning
confidence: 99%
“…This optimal behavior is achieved with the MOS capacitor biased in the region where the capacitance is strongly dependent on applied voltage. In most prior studies [16,[20][21][22][23][24][25] these performances were measured under laboratory conditions, with the sensor small-signal C-V characteristics extracted using semiconductor parameter analyzers. In order to ensure precision, noise suppression, energy efficiency and portability requirements for sensor operation in real conditions, a readout circuit is mandatory [26][27][28][29][30].…”
Section: Introductionmentioning
confidence: 99%
“…In particular, silicon carbide (SiC) has emerged as a viable alternative to replace Si in power and harsh-environment applications. SiC technology is very similar with that of Si and, in the last decade, its manufacturing processes have matured considerably, especially regarding the improvement in fabricated material defect density [ 12 , 13 , 14 , 15 , 16 , 17 , 18 ] and reliability of SiC-based devices [ 19 , 20 , 21 , 22 , 23 , 24 , 25 , 26 ]. In this regard, the simplest and most technologically mature device is the Schottky diode (SBD).…”
Section: Introductionmentioning
confidence: 99%