2014
DOI: 10.1016/j.egypro.2014.03.227
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A New Instrument for Measuring the Reflectance Distribution Function of Solar Reflector Materials

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Cited by 14 publications
(9 citation statements)
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“…The first task has been accomplished quickly and with good results; the second is in stand-by, waiting for the completion of the two new instruments MIRA (DLR) [4] and VLABS (ISE) to verify the results achieved with the Solar Mirror Qualification developed by ENEA [5,6].…”
Section: Introductionmentioning
confidence: 99%
“…The first task has been accomplished quickly and with good results; the second is in stand-by, waiting for the completion of the two new instruments MIRA (DLR) [4] and VLABS (ISE) to verify the results achieved with the Solar Mirror Qualification developed by ENEA [5,6].…”
Section: Introductionmentioning
confidence: 99%
“…In this case, a lack of commercial or validated instrumentation to adequately characterize it, according to the SolarPACES reflectance guideline, was noticed during the SRRR [3]. Some new instruments to properly measure the spectral near-specular reflectance, ρ s (λ,θ,φ), of all type of reflector materials are under development or have been recently developed by some of the institutions, such as the SMQ by ENEA [6,7], the MIRA by DLR [8,9] and the VLABS by ISE Fraunhofer [10]. Additional research work to compare the results and to establish the measurement procedure is still required.…”
Section: Introductionmentioning
confidence: 99%
“…DLR also has developed two other instruments. The MIRA uses the principle of a parallel imaging goniophotometer to measure near specular scatter, mapping the BRDF by means of a 180º circular fisheye lens and a CCD detector array [92], [93]. DLR has also designed an accessory for the PE Lambda spectrophotometer.…”
Section: Discussionmentioning
confidence: 99%
“…MIRA is a new prototype instrument which has been developed by DLR at the OPAC Laboratory at the PSA in 2012 to measure near specular scatter and evaluate its impact on specular reflectance [92], [93] (see Figure 33). The instrument allows the distinction of the high intensity specular peak and the low intensity scatter by taking two measurements with different sensitivity settings for the CCD chip.…”
Section: Mirror Reflectance Function Analyzer (Mira) By Dlrmentioning
confidence: 99%