2018
DOI: 10.1016/j.micpro.2018.03.012
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A novel configurable ring oscillator PUF with improved reliability using reduced supply voltage

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Cited by 9 publications
(10 citation statements)
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“…In [45,43,44], authors discussed aging tolerant methodologies for sustainable operation of circuits. The summary of the related work is conferred in Table 1.…”
Section: Related Prior Researchmentioning
confidence: 99%
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“…In [45,43,44], authors discussed aging tolerant methodologies for sustainable operation of circuits. The summary of the related work is conferred in Table 1.…”
Section: Related Prior Researchmentioning
confidence: 99%
“…This section briefs how aging affects the oscillation frequency of RO and its mitigation. As discussed in [45], out of different sources of aging like NBTI (negative bias temperature instability) and HCI (hot carrier injection), NBTI is the primary cause of degradation in the oscillation frequency of RO. The degradation in f ossc of RO due to NBTI occurs even if the RO is in an idle state.…”
Section: Reliability Degradationmentioning
confidence: 99%
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“…Since the introduction of the ring oscillator implementation on FPGAs by Boemo and Lopez-Buedo [13], there has been various reports on new applications and techniques to utilise the ring oscillators as thermal sensors [14][15][16][17][18]. The clear advantages of ring oscillator implementation are hot spot detection, signal contentions and flexibility in supporting multiple input sensors for thermal measurement of the FPGA [19,20]. The ring oscillator is chosen due to its near-linear dependence of logic delay on temperature [17,21].…”
Section: Introductionmentioning
confidence: 99%