“…Due to the correlation between electrical properties of the grain and MC level [4], methods for monitoring MC were proposed, including monitoring variations in the Sparameters (i.e., return loss and insertion loss) [1], [2], [5]− [7], [14], [23]− [33], [20], dielectric constant [8]− [10], [11], [22], [34]− [36], and impedance (i.e., through reflected voltages) [4], [21], [37], [38]. These can be achieved by implementing coaxial probes [31]− [33], [35], [18], ring antennas [1], [21], [26], [37], [17], horn antennas [25], [27], [28], [30], [34], [39], waveguides [27], [28], [31], and microstrip patch antennas [24], [29], [36], [40]− [43], [15], [16], [20].…”