2023
DOI: 10.3390/s23020705
|View full text |Cite
|
Sign up to set email alerts
|

A Novel System to Increase Yield of Manufacturing Test of an RF Transceiver through Application of Machine Learning

Abstract: Electronic manufacturing and design companies maintain test sites for a range of products. These products are designed according to the end-user requirements. The end user requirement, then, determines which of the proof of design and manufacturing tests are needed. Test sites are designed to carry out two things, i.e., proof of design and manufacturing tests. The team responsible for designing test sites considers several parameters like deployment cost, test time, test coverage, etc. In this study, an automa… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2024
2024
2024
2024

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
references
References 36 publications
0
0
0
Order By: Relevance