A preliminary study of counterfeit electronic components using Raman spectroscopy

Abstract

In today’s world, people are surrounded by diverse electronic devices. Their integral parts are electronic components. In recent years, an increasing incidence of counterfeit electronic components has appeared which may compromise reliability, functionality and other related purposes. The aim of the paper is to determine whether Raman spectroscopy is a suitable method for assessing the authenticity of electronic components on the basis of material analysis. Raman spectroscopy is a powerful method for material identification offering specific information on molecular level. The focus of measurements was on materials of packages and the markings. The polymer-based and ceramic-based electronic components were analysed as well as the paints of the markings. The results of this preliminary study positively indicate the potential to distinguish different materials of electronic components by Raman spectroscopy.