A Prevenient Voltage Stress Test Method for High Density Memory

Yim, Jong-Su; kim, Gunbae; Nam, In-Hyun; Son, Sangki; Lim, Jonghyoung; Lee, Hwacheol; Kang, S. K.; Kwak, Byung-Heon; Lee, Jin-Seok; Kang, Sungho

doi:10.1109/delta.2008.93

4th IEEE International Symposium on Electronic Design, Test and Applications (Delta 2008) 2008

DOI: 10.1109/delta.2008.93

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A Prevenient Voltage Stress Test Method for High Density Memory

Jong-Su Yim

Gunbae kim

In-Hyun Nam

et al.

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A Prevenient Voltage Stress Test Method for High Density Memory

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References 13 publications

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