2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems 2011
DOI: 10.1109/dft.2011.19
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A Probabilistic Approach to Diagnose SETs

Abstract: In recent work, the error latching probability due to an SET is calculated for a single observable point, and this help in hardening the design. This paper utilizes a recently proposed probabilistic framework for SET propagation in order to diagnose (on-line or off-line) the location and time of strike based on errors observed at multiple points. The proposed diagnostic framework requires a new approach to calculate the probability for SET propagation to multiple non-independent variables. It is shown experime… Show more

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