A sequential constant‐stress accelerated life testing scheme and its Bayesian inference

Liu, Xiao; Tang, Loon Ching

doi:10.1002/qre.958

Cited by 14 publications

(10 citation statements)

References 17 publications

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“…Sequential test method [40][41][42][43] Number of stress levels Singe stress level Double or multiple stress levels [44][45][46][47][48][49][50][51][52][53][54][55] Statistical models…”

Section: Continuous Testingmentioning

confidence: 99%

“…The two objectives include the estimation of the parameter range, and the obtained optimal plan was the plan taking into account the parameter estimation errors. In addition, Tang and Liu [40,41,59] attempted to consider and control the process of giving the prior estimates in the framework of sequential tests during the plan design. It was perhaps a more complete approach.…”

Section: Solutions To Robustness and Limited Sample Sizementioning

confidence: 99%

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Design of Accelerated Life Test Plans—Overview and Prospect

Chen

Gao

Pan

et al. 2018

Chin. J. Mech. Eng.

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Accelerated life test (ALT) is currently the main method of assessing product reliability rapidly, and the design of efficient test plans is a critical step to ensure that ALTs can assess the product reliability accurately, quickly, and economically. With the promotion of the national strategy of civil-military integration, ALT will be widely used in the research and development (R&D) of various types of products, and the ALT plan design theory will face further challenges. To aid engineers in selecting appropriate theories and to stimulate researchers to develop the theories required in engineering, with focus on the demands for theory research that arise from the implementation of ALT, this paper reviews and summarizes the development of ALT plan design theory. The development of the theory and method for planning optimal ALT for location-scale distribution, which is the most applied and mature theory of designing the optimal ALT plan, are described in detail. Taking this as the center of radiation, some problems that ALT now faces, such as the verification of the statistical model, limitation of sample size, solutions of resource limits, optimization of the test arrangement, and management of product complexity, are discussed, and the general ideas and methods of solving these problems are analyzed. Suggestions for selecting appropriate ALT plan design theories are proposed, and the urgent solved theory problems and opinions of their solutions are proposed. Based on the principle of convenience for engineers to select appropriate methods according to the problems found in practice, this paper reviews the development of optimal ALT plan design theory by taking the engineering problems arising from the ALT implementation as the main thread, provides guidelines on selecting appropriate theories for engineers, and proposes opinions about the urgent solved theory problems for researchers.

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“…Sequential test method [40][41][42][43] Number of stress levels Singe stress level Double or multiple stress levels [44][45][46][47][48][49][50][51][52][53][54][55] Statistical models…”

Section: Continuous Testingmentioning

confidence: 99%

Section: Solutions To Robustness and Limited Sample Sizementioning

confidence: 99%

Design of Accelerated Life Test Plans—Overview and Prospect

Chen

Gao

Pan

et al. 2018

Chin. J. Mech. Eng.

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show abstract

“…To illustrate the information transfer and decay, we construct prior distribution of ( , ) μ σ at 45 o C and 65 o C temperature levels using equation (6). The results are shown in Fig.3.…”

Section: B Test Design and Data Analysis At The Highest Temperature mentioning

confidence: 98%

“…The test was done in a sequential manner (see Liu and Tang 2008), that is, the experiment at the highest stress level was firstly conducted. Then, based on the information obtained, engineers developed the plan for the following tests at lower stress level.…”

Section: Introductionmentioning

confidence: 99%

Auxiliary acceleration factor for sequential Accelerated Life Tests: A case study

Liu

Tang

2008

2008 IEEE International Conference on Industrial Engineering and Engineering Management

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Accelerated Life Testing (ALT) has been extensively used in manufacturing industry so as to quickly obtain information about product reliability. However, when stress levels are low, failures can still be elusive. To mitigate this problem, a common remedy is to specify a minimum number of failures which may result in long test time and/or excessive extrapolation. In this paper, an auxiliary acceleration factor, with its effect well defined, is employed to amplify the failure probability at low stress levels. Particularly, it is proposed that the auxiliary stress is loaded under a step-stress loading pattern so that the initial stress level will not be too harsh for the product. Based on Weibull failure time and time censoring (type-I) scheme, we demonstrate an approach for embedding an auxiliary acceleration factor into the design of sequential constantstress ALT through a case study.

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“…This literature treats a variety of models (distributions and relationships), approaches of estimation, and different types of censoring. For example, see Abdel Ghaly et al (1998), Drop and Mazzuchi (2004), Escobar and Meeker (2006), Liu and Tang (2009), and Abdel Ghaly et al (2015).…”

Section: Introductionmentioning

confidence: 99%

Adapting The Extended Neyman’s Smooth Test to Be Used in Accelerated Failure Time Models

Abdel-Ghaly¹,

Aly²,

Abdel-Rahman³

2021

Journal of Data Science

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Accelerated life testing (ALT) has gained greater importance because of dealing with high reliability units. As a result, there is a big need to use a goodness of fit (GOF) technique for testing the underlying lifetime distribution. But there is a difficulty due to the existence of several stress levels with different samples of units at each level. Then, the choice of a certain GOF technique is based on its capability to combine the failure times from all stress levels to reach a conclusion about the adequacy of a certain lifetime distribution at each stress level. In this paper, the extended Neyman's smooth test (ENST) is chosen. It is then modified in order to be used in validating the distributional assumption of accelerated failure time (AFT) model. This modified method is called; the adapted extended Neyman's smooth test (AENST). It is applied to test for both Weibull and exponential distributions in case of constant stress under complete sampling. To check the performance of the AENST, a comparison is made with the conditional probability integral transformation test (CPITT) via a simulation study. Moreover, a real data set is provided to illustrate the application of the introduced AENST. The results revealed that the AENST is a powerful test comparing with the CPITT. Thus, the AENST is recommended for testing the AFT models.

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A sequential constant‐stress accelerated life testing scheme and its Bayesian inference

Cited by 14 publications

References 17 publications

Design of Accelerated Life Test Plans—Overview and Prospect

Design of Accelerated Life Test Plans—Overview and Prospect

Auxiliary acceleration factor for sequential Accelerated Life Tests: A case study

Adapting The Extended Neyman’s Smooth Test to Be Used in Accelerated Failure Time Models

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