“…In this paper we focus on the derivation of a system endto-end reliability estimate, called single use reliability (both mean and variance), driven solely by the test data without any mathematical growth assumptions, given the Markov chain usage model, and improve on an earlier analytical solution described in [8]. Our new derivation of the mean was inspired earlier and published in [2], however, it was not until recently that we figured out a new derivation of the variance that is similarly simpler, faster, more direct, and more intuitive, which arrived through a rather convoluted path. The derivation in [8] follows from the definitions of mean and variance and only first principles, which could be a little counter-intuitive to understand.…”