IEEE Trans. Electron Devices
 2023
DOI: 10.1109/ted.2023.3274621
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A Simulation Study of Junctionless Forksheet on Sub-2 nm Node Logic Applications

Xinlong Shi
1
,
Tao Liu
2
,
Ying Wang
3
et al.
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Cited by 2 publications
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Characteristic Variability of GAA Si NS CFETs Induced by Process Variation Effect and Intrinsic Parameter Fluctuation

Chuang,
Kola,
Li
2024
2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
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Characteristic Variability of GAA Si NS CFETs Induced by Process Variation Effect and Intrinsic Parameter Fluctuation

Chuang,
Kola,
Li
2024
2024 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
0
0
0
0
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Demonstration of a Vertically Stacked Junctionless Forksheet as Dielectric Modulated Biosensor

Gandhi,
Jaisawal,
Kondekar
et al. 2024
2024 28th International Symposium on VLSI Design and Test (VDAT)
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