A Single-Block TRL Test Fixture for the Cryogenic Characterization of Planar Microwave Components

Abstract

The High Temperature-Superconductivi b, (HTS) group of the RF Technology Branch, Space Electronics Division, is actively involved in the fabrication and cryogenic characterization of planar microwave components for space applications. This process requires fast, reliable, and accurate nleasurement techniques not readily available. A new calibration standard/test fixture that