2017 International Conference on Simulation of Semiconductor Processes and Devices (SISPAD) 2017
DOI: 10.23919/sispad.2017.8085285
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A SPICE-compatible model of SG-MONOS for 28nm flash macro design considering the parasitic resistance caused by trapped charges

Risho Koh
1
,
Miyamori Mitsuru
2
,
K. Tsuneno
3
et al.
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