Near‐infrared (NIR) imaging is used in conjunction with near ambient pressure X‐ray photoelectron spectroscopy (APXPS) to study chemical and electrochemical redox processes on a ceria‐based solid oxide electrochemical cell (SOC). Electrochemical water electrolysis tests conducted in ambient operating conditions on standard SOCs show that NIR imaging can be used to spatially resolve the electrochemically active regions associated with an accumulation of Ce3+. These effective emissivity changes are attributed to changes in optical properties (e.g. the index of refraction) of ceria that occur upon reduction. These data correlate strongly with APXPS measurements, simultaneously supporting the model (near ambient conditions and single‐sided cell setup required by APXPS experiments) and the ability to elucidate mechanistic details on an operating SOC using an inexpensive, convenient NIR imaging technique.