1991
DOI: 10.1002/ecjb.4420740707
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A study on measurement and simulation for the propagation characteristics of through‐hole

Abstract: With the recent rapid advance in electronic technology, electronic components have become smaller, lighter and higher in performance. In connection with this trend, there has been increased use of the high frequencies due to increased speed of the devices. Under such situations, the interconnects between the electronic devices must be treated as strip lines. Especially, the through‐hole with a three‐dimensional structure indispensable for high‐density interconnects has nonnegligible effects on the circuits. He… Show more

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