2024 IEEE International Reliability Physics Symposium (IRPS) 2024
DOI: 10.1109/irps48228.2024.10529395
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A TCAD to SPICE Framework for Isolation of BTI and HCD in GAA-SNS FETs and to Estimate Impact on RO Under Normal and Overclocking Conditions

Karansingh Thakor,
Payel Chatterjee,
Souvik Mahapatra
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