2012
DOI: 10.1063/1.4745027
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A transient electron transport analysis of bulk wurtzite zinc oxide

Abstract: A three-valley Monte Carlo simulation approach is used in order to probe the transient electron transport that occurs within bulk wurtzite zinc oxide. For the purposes of this analysis, we follow O’Leary et al. [Solid State Commun. 150, 2182 (2010)], and study how electrons, initially in thermal equilibrium, respond to the sudden application of a constant applied electric field. We find that for applied electric field strength selections in excess of 300 kV/cm that an overshoot in the electron drift velocity i… Show more

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Cited by 19 publications
(10 citation statements)
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“…This result suggests that the lowfield electron drift mobility associated with a semiconductor will diminish as the E o energy gap is increased. [199] for the case of wurtzite InN, and Hadi et al [196] for the case of wurtzite ZnO. This table has been modified from Table 2 of O'Leary et al [110] and Table 2 of Hadi et al [204].…”
Section: A Critical Comparison With Other Compound Semiconductorsmentioning
confidence: 95%
See 4 more Smart Citations
“…This result suggests that the lowfield electron drift mobility associated with a semiconductor will diminish as the E o energy gap is increased. [199] for the case of wurtzite InN, and Hadi et al [196] for the case of wurtzite ZnO. This table has been modified from Table 2 of O'Leary et al [110] and Table 2 of Hadi et al [204].…”
Section: A Critical Comparison With Other Compound Semiconductorsmentioning
confidence: 95%
“…This table has been modified from Table 1 of O'Leary et al [110] and Table 1 of Hadi et al [204]. Copyright permission was obtained from Springer a Parameters from O'Leary et al [110] b Parameters from O'Leary et al [110] c Parameters from Hadi et al [199] d Parameters from Hadi et al [196] energy gap. The material and band structural parameters, used for this critical comparative analysis, are drawn from Tables 1 and 2, Adachi [15], Hadi et al [204], and Sze and Ng [227].…”
Section: A Critical Comparison With Other Compound Semiconductorsmentioning
confidence: 98%
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