A Unified Detection Scheme for Crosstalk Effects in Interconnection Bus

Li, K. Shu-Min; Lee, Chung-Len; Su, Chauchin; Chen, J.E.

doi:10.1109/tvlsi.2008.2004548

Cited by 12 publications

(2 citation statements)

References 20 publications

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“…Meanwhile, the influence of inductance coupling on crosstalk cannot be neglected due to the fact that as the frequency of system clock increases continuously, [5−8] crosstalk is more and more influenced by the technological parameters of the integrated circuits. [9,10] Therefore, it is necessary to analyse the influence of the thermal profile effect of multilevel interconnects on the resistanceinductance-capacitance (RLC) crosstalk.…”

Section: Introductionmentioning

confidence: 99%

An RLC interconnect analyzable crosstalk model considering self-heating effect

Zhu¹,

Liu²

2012

Chinese Phys. B

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According to the thermal profile of actual multilevel interconnects, in this paper we propose a temperature distribution model of multilevel interconnects and derive an analytical crosstalk model for the distributed resistanceinductance-capacitance (RLC) interconnect considering effect of thermal profile. According to the 65-nm complementary metal-oxide semiconductor (CMOS) process, we compare the proposed RLC analytical crosstalk model with the Hspice simulation results for different interconnect coupling conditions and the absolute error is within 6.5%. The computed results of the proposed analytical crosstalk model show that RCL crosstalk decreases with the increase of current density and increases with the increase of insulator thickness. This analytical crosstalk model can be applied to the electronic design automation (EDA) and the design optimization for nanometer CMOS integrated circuits.

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Section: Introductionmentioning

confidence: 99%

An RLC interconnect analyzable crosstalk model considering self-heating effect

Zhu¹,

Liu²

2012

Chinese Phys. B

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“…crosstalk faults), this architecture includes a modified driving cell and an observation cell. K.Shumin [7] studied the crosstalk fault, namely, glitch and crosstalkinduced delay, in the system-on-chip (SOC) interconnect, and proposed a unified detecteion scheme. B.Xiaoliang [8] proposed a high level crosstalk defect simulation method for long interconnects in system on chips, it can evaluate crosstalk defect coverage of existing tests and facilitate the development of a crosstalk test method.…”

Section: Introductionmentioning

confidence: 99%

Test Generation for Glitch Faults of Crosstalk Effects in Digital Circuits Based on Genetic Algorithm with Niche

Pan

Chen

2010

AMM

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The more signal path ways close to each other in digital circuits, the greater the coupling effects. The coupling effects can led to an increasing number of signal integrity related faults such as crosstalk faults. In this paper, the glitch faults of crosstalk effects are studied. First of all, the test vector generation using signal paths of circuits is given. Secondly, a new test method for crosstalk faults in digital circuits is presented, which is based on the genetic algorithm with niche. The test method can detect the maximal crosstalk effects, i.e. the test vectors to be produced is to switch a set of aggressors that maximizes the switching of total coupling effects. The test method is also used to produce the test vectors of multiple crosstalk faults. The experimental results show that the method proposed in this paper can get the test vectors of the multiple crosstalk faults if the faults are testable.

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Test Pattern Generation for Multiple Victim Lines of Crosstalk Effect in Digital Circuits by Binary Decision Diagram

Zhang

Ling

2016

Proceedings of the 2015 International Conference on Electrical and Information Technologies for Rail Transportation

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A Unified Detection Scheme for Crosstalk Effects in Interconnection Bus

Cited by 12 publications

References 20 publications

An RLC interconnect analyzable crosstalk model considering self-heating effect

An RLC interconnect analyzable crosstalk model considering self-heating effect

Test Generation for Glitch Faults of Crosstalk Effects in Digital Circuits Based on Genetic Algorithm with Niche

Test Pattern Generation for Multiple Victim Lines of Crosstalk Effect in Digital Circuits by Binary Decision Diagram

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