Abstract:The primary characteristics that one identifies from infrared (IR) spectra of ultrathin films for further analysis are the resonance frequencies, oscillator strengths (extinction coefficients), and damping (bandwidths), related to different kinds of vibrational, translational, and frustrated rotational motion inside the thin-film material [1][2][3][4][5][6][7]. However, the microscopic processes inside or at the surface of a film (motion of atoms and electrons) give rise to the frequency dependence (the disper… Show more
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