2012 13th International Conference on Electronic Packaging Technology &Amp; High Density Packaging 2012
DOI: 10.1109/icept-hdp.2012.6474852
|View full text |Cite
|
Sign up to set email alerts
|

Accelerated test and life evaluation method of microwave tube in short vacuum tube

Abstract: Microwave tubes for communication must have high reliability, high power, and a long life of 10 to 15 years. Cathode as the electric source module in microwave vacuum tubes, its reliability and life directly affect the tube's reliability and life. In this paper, electronic gun in short tubes are accelerated to evaluate the lifetime of one kind of microwave vacuum (such as traveling wave tube). In order to shorten the testing process, accelerated life-test tests method is established at higher operating tempera… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2014
2014
2017
2017

Publication Types

Select...
1
1

Relationship

0
2

Authors

Journals

citations
Cited by 2 publications
references
References 4 publications
(2 reference statements)
0
0
0
Order By: Relevance