2017
DOI: 10.1016/j.cplett.2017.01.065
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Accessing the structural and thermodynamic properties of ultra-thin layers of C32 adsorbed on a SiO2 surface

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Cited by 4 publications
(3 citation statements)
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“…This growth model has been reported for vapor deposited and dip-coated films by employing surface-sensitive x-ray scattering methods [32], atomic force microscopy (AFM) [33] and ellipsometry [31]. Molecular Dynamics simulations corroborate this peculiar multilayer structure [34,35] and trace it to a subtle interplay of intermolecular interactions of the rod-like molecules and their interaction with the oxidic substrate.…”
Section: Introductionsupporting
confidence: 64%
“…This growth model has been reported for vapor deposited and dip-coated films by employing surface-sensitive x-ray scattering methods [32], atomic force microscopy (AFM) [33] and ellipsometry [31]. Molecular Dynamics simulations corroborate this peculiar multilayer structure [34,35] and trace it to a subtle interplay of intermolecular interactions of the rod-like molecules and their interaction with the oxidic substrate.…”
Section: Introductionsupporting
confidence: 64%
“…While on dielectric surfaces, a model is confirmed by Volkmann et al ,,,,, that both dip-coated and evaporated dotriacontane (DTC, n -C 32 H 66 ) films on the SiO 2 surface are composed of two layers. This so-called “2 + 1” model is composed by a bilayer formed adjacent to the substrate with the DTC long axis oriented parallel to the surface (tilt-on, flat-on, or edge-on), and above this bilayer, a monolayer of end-up DTC molecules is assembled with the chain perpendicular to the surface.…”
Section: Introductionmentioning
confidence: 89%
“…(d) and (e) Lateral and top views of paraffin coating structure with parallel bilayer and perpendicular monolayer. Reproduced with permission from ref . Copyright 2017 Springer-Verlag.…”
Section: Methodsmentioning
confidence: 99%