2014
DOI: 10.1021/ac503409c
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Accounting for Nanometer-Thick Adventitious Carbon Contamination in X-ray Absorption Spectra of Carbon-Based Materials

Abstract: Near-edge X-ray absorption fine structure (NEXAFS) spectroscopy is a powerful technique for characterizing the composition and bonding state of nanoscale materials and the top few nanometers of bulk and thin film specimens. When coupled with imaging methods like photoemission electron microscopy, it enables chemical imaging of materials with nanometerscale lateral spatial resolution. However, analysis of NEXAFS spectra is often performed under the assumption of structural and compositional homogeneity within t… Show more

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Cited by 75 publications
(102 citation statements)
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“…A detailed description of the experimental procedures for acquiring and processing the NEXAFS data is reported in Ref. [21] and in the Supporting Information.…”
Section: Methodsmentioning
confidence: 99%
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“…A detailed description of the experimental procedures for acquiring and processing the NEXAFS data is reported in Ref. [21] and in the Supporting Information.…”
Section: Methodsmentioning
confidence: 99%
“…Since no theory exists to predict the π*/σ* ratio, a reference material with known sp 2 A graphical representation of the methodology is shown in Figure S.1. Since the C1s→π* transition usually appears in NEXAFS spectra of a-C materials as a distinct spectral feature at around 285.0 eV, its area can be determined by fitting it with a Gaussian synthetic peak 21,47 .…”
Section: Section I ð Methodology For the Quantitative Evaluation Of Tmentioning
confidence: 99%
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