Accuracy in Refractive Index Measurement of As2Se3 Chalcogenide Glass by IR Spectroscopic Ellipsometer

Yang, 李杨 Li; Yongxing, 刘永兴 Liu; Shixun, 戴世勋 Dai; Tiefeng, 徐铁峰 Xu; Changgui, 林常规 Lin; Feifei, 陈飞飞 Chen

doi:10.3788/aos201838.0612002

光学学报

2018

DOI: 10.3788/aos201838.0612002

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Accuracy in Refractive Index Measurement of As2Se3 Chalcogenide Glass by IR Spectroscopic Ellipsometer

李杨 Li Yang¹,

刘永兴 Liu Yongxing²,

戴世勋 Dai Shixun³

et al.

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Accuracy in Refractive Index Measurement of As2Se3 Chalcogenide Glass by IR Spectroscopic Ellipsometer

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