Abstract:As process variations increase and devices get more diverse in their behavior, using the same test list for all devices is increasingly inefficient. Methodologies that adapt the test sequence with respect to lot, wafer, or even a device's own behavior help contain the test cost while maintaining test quality. In adaptive test selection approaches, the initial test list, a set of tests that are applied to all devices to learn information, plays a crucial role in the quality outcome. Most adaptive test approache… Show more
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