Adversarial Testing: A Novel On-Line Testing Method for Deep Learning Processors

Li, Wen; Wang, Ying; Zou, Kaiwei; Li, Huawei; Li, Xiaowei

doi:10.1109/ats59501.2023.10317994

2023 IEEE 32nd Asian Test Symposium (ATS) 2023

DOI: 10.1109/ats59501.2023.10317994

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Adversarial Testing: A Novel On-Line Testing Method for Deep Learning Processors

Wen Li,

Ying Wang,

Kaiwei Zou

et al.

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Adversarial Testing: A Novel On-Line Testing Method for Deep Learning Processors

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References 17 publications

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