“…DC breakdown voltage largely depends on the lm quality, such as surface roughness, chemical defects, and physical impurities. 30,31 Therefore, a large distribution of data points was taken using a Weibull statistical analysis to check their failure probability to assess the effect of extrinsic factors like dust, residual solvent, small molecules, and crystallization, which are responsible for lower probability breakdown, as shown in Fig. 4.…”